Highly Powerful XRF Analyser

When it comes to precisely evaluating your samples’ elemental composition, measuring coating thickness of multiple layers or simply identifying a material type, there’s no instrument that can do all in one like FISCHERSCOPE® X-RAY XDV®-SDD bench-top XRF analyser.


Whether you need to accurately measure the plating thickness of your products, identify the metal type of incoming raw materials or determine individual chemical elements for research purposes or RoHS, WEEE & CPSIAWEEE, CPSIAWEEE, CPSIA compliance then FISCHERSCOPE® X-RAY XDV®-SDD gives you the flexibility to safely measure large and small parts in hard and easy to reach locations. This XRF is ideal for nondestructive measurement of multiple extremely thin coating layers, complex material combinations and alloys.

Designed with an easily programmable XY-Stage and Z-Axis, FISCHERSCOPE® X-RAY XDV®-SDD bench-top XRF analyser can be automated for measurements of extremely thin coatings and trace analysis even by untrained operators. Outstanding accuracy and long-term stability are characteristics of all FISCHERSCOPE X-RAY systems.

Powerful Silicon Drift Detector (SDD) can identify a wide range of materials Al(13) to U(92) within just 5 seconds, while micro-focus X-ray tube with tungsten target and beryllium window ensures long-lasting service for many years. The necessity of re-calibration is dramatically reduced, saving time and effort as all instruments are calibrated to your specific applications before the delivery.



  • Precise coating thickness evaluation of Gold, Palladium and Nickel layers on Copper in PCB applications.Simplifying quality control on PCBs with automatic pattern recognitionD
  • Simplifying incoming good inspection and quality assurance on PCBs with automatic pattern recognition.
  • Directly measurable concentrations of phosphorous content in Electroless Nickel applications
  •  Analysis of the metallic content in plating solutions, such as AuCuCd, AuCuIn, RhRu to ensure an even colour finish.
  • Analysis of harmful substances textiles for  Oeko-Tex certification
  • Trace element analysis (mainly led and cadmium) in materials for fashion jewellery and accessories
  • Identification of undesirable substances (e.g. heavy metals) in electronics, packaging and consumer goods to RoHS, WEEE, CPSIA and other guidelines.
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    Whether you know what type of machine you require or have questions surrounding our product range, we are always happy to assist.

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    01386 577370

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