Our compact XRF range
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XAN® 220/222
Mid-range XRF for material analysis of precious metals and coating thickness. S(16) to U (92).
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XAN® 250/252
High Performance XRF for fast material analysis and coating thickness. Al (13) to U (92).
Non-destructive coating thickness and material analysis
Our XAN series machines are designed as compact and user-friendly bench-top instruments. In order to allow quick and easy sample positioning, the X-ray source and the detector are positioned in the instrument’s lower chamber. Hence, the measuring direction is from underneath the sample that is supported by a transparent window. Exactly this feature offers easy sample positioning and fast routine measurements.
The integrated video-microscope with zoom and crosshairs simplifies sample placement and allows precise measuring spot adjustment. The entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC, using the powerful and user-friendly WinFTM® software.
Powerful Silicon Drift Detector detects and processes very-high count rates across a wide range of materials Al(13) to U(92). This dramatically reduces the measurement time and significantly increases the resolution and accuracy of the readings. Meanwhile, micro-focus X-ray tungsten tube with beryllium window ensures long-lasting service for many years. The necessity of re-calibration is drastically reduced, saving time and effort as all instruments are calibrated to your specific applications before the delivery.
Features and benefits of our FISCHERSCOPE® X-RAY XAN® compact XRF machines
- Compact bench-top instrument for the non-destructive material analysis and coating thickness measurement
- 4 interchangeable aperture sizes (down to 0.2 mm) allows to focus and measure in localised spots
- Extremely safe. Thick metal shielding fully protects operators and visitors from hazardous X-ray energy.
- Doesn’t require any sample preparation and outputs precise results with average test times of 5 seconds.
- Spacious chamber fits big and small samples
- Small concentrations in the trace analysis to RoHS &WEEE
- Various sized samples can be tested in specific regions thanks to the bottom up measurement.
- Big samples can be allocated thanks to the spacious chamber with the usable sample placement area of 403x588x444mm.
- WinFTM software for seamless measurements, data collection and processing comes pre-installed on PC or laptop.
- Instant results, automated data storage and labelling allows a high throughput of samples.
What are compact XRF machines used for?
- Precious metal analysis via X-ray fluorescence for assaying offices and precious metals refineries
- Using X-ray fluorescence for fast, reliable gold analysis in the gold-buying industry
- Analysis of Tarnish-Resistant Silver Alloys
- Determination of the Silver Content of Silver Plated or Blanched Silver Alloys
- Trace element analysis (mainly led and cadmium) in materials for fashion jewellery and accessories
- Identification of undesirable substances (e.g. heavy metals) in electronics, packaging and consumer goods to RoHS, WEEE, CPSIA and other guidelines.
Contact us now for more information
Whether you know what type of machine you require or have questions surrounding our product range, we are always happy to assist.
Get in touch and we will help you find the XRF machine that best suits your needs. Our team has many years of experience and is always happy to answer your questions.
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